- Masanori Hashimoto (Osaka Univ.)
Soft Error Rate Estimation with TCAD and Machine Learning - Yung-Huei Lee (TSMC)
A New Method of Time-Zero and BTI-Aging Vt Stability to Forecast Advanced Planar and FinFET SRAM Reliability - Andreas Schenk (ETH Zurich)
The Impact of Hetero-junction and Oxide-interface Traps on the Performance of InAs/Si and InAs/GaAsSb Nanowire Tunnel FETs - Kurt Stokbro (Quantum Wise)
New Approaches for First Principles Modelling of Inelastic Transport in Nanoscale Semiconductor Devices with Thousand of Atoms - Sivakumar P. Mudanai (Intel)
Unique Challenges in Compact Modeling
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