- Mario Ancona (Naval Research Laboratory)
Nonlinear thermoelectroelastic simulation of III-N devices
- Asen Asenov (University of Glasgow)
Progress in the simulation of time dependent statistical variability in nano CMOS transistors
- Jean-Pierre Colinge (Taiwan Semiconductor Manufacturing Company)
Nanowire transistors: pushing Moore's law to the limit
- Tibor Grasser (Vienna University of Technology)
Advanced modeling of charge trapping: RTN, 1/f noise, SILC, and BTI
- Kohji Mitsubayashi (Tokyo Medical and Dental University)
Novel biosensing devices for medical applications
- Christian Sandow (Infineon Technologies)
Exploring the limits of the safe operation area of power semiconductor devices
- Mark Stettler (Intel Corporation)
Device and process modeling: 20 years at Intel's other fab
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