VPAD 1993 Proceedings
- J.-G. Ahn, Y.-J. Park, H.S. Min:
"A New Hydrodynamic Model for High Energy Tail Electrons";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 28 - 29.
- N. Aluru, K.H. Law, P.M. Pinsky, A. Raefsky, R.J. Goossens, R.W. Dutton:
"Space-Time Galerkin/Least-Squares Finite Element Formulation for the Hydrodynamic Device Equations";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 16 - 17.
- H. Aoki, E. Khalily:
"A New Semi-Empirical Model for Amorphous Silicon Thin-Film-Transistors";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 138 - 139.
- R. Bauer, M. Stiftinger, S. Selberherr:
"Capacitance Calculation of VLSI Multilevel Wiring Structures";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 142 - 143.
- H. Brand, S. Selberherr:
"Electrothermal Analysis of Latch-Up in an IGT";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 116 - 117.
- L. Colalongo, M. Rudan:
"ROW-Type Methods Applied to the Time Discretization of Device Equations";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 124 - 125.
- D. Collard, V. Senez, B. Baccus:
"2D Process Simulation with Accurate Dopant and Stress Profiles Calculations";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 92 - 93.
- P. Conti, M. Tomizawa, A. Yoshii:
"A System for 3D Simulations of Complex Si and Heterostructure Devices";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 14 - 15.
- N.E. Cowern:
"A Physics-Based Model for Transient Diffusion of Dopants in Si";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 50 - 51.
- K.M. De Meyer, R. Cartuyvels, L. Dupas:
"A Simulation Strategy for Process Optimization";
Talk: Conference, Nara, Japan (invited); 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 80 - 83.
- N.R. Desai, K.V. Hoang:
"Integrated Modeling of the AIGaAs/GaAs Heterojunction Bipolar Transistor";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 158 - 159.
- S.T. Dunham:
"Consistent Quantitative Models for the Coupled Diffusion of Dopants and Point Defects in Silicon";
Talk: Conference, Nara, Japan (invited); 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 46 - 49.
- R.W. Dutton:
"Algorithms and TCAD Software Using Parallel Computation";
Talk: Conference, Nara, Japan (invited); 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 10 - 12.
- M. Ershov, V. Ryzhii:
"Electron Transport Models for Unstrained and Strained Si and SiGe";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 110 - 111.
- W. Fichtner:
"From Layout to Circuit:Multi-Dimensional Process and Device Simulation - Current Status and Open Problems";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 2 - 5.
- C. Fiegna, H. Iwai, T. Kimura, S. Nakamura, E. Sangiorgi, B. Ricco:
"Monte Carlo Analysis of Hot Carrier Effects in Ultra Small Geometry MOSFETs";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 102 - 103.
- M. Hane, S. Hasegawa:
"Dynamic-Clustering and Grain-Growth Kinetics Effects on Dopant Diffusion in Polysilicon";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 52 - 53.
- K. Harafuji, A. Misaka, M. Kubota, N. Nomura:
"Modeling of Surface Reactions for Predicting Dry-Etched Profiles";
Talk: Conference, Nara, Japan (invited); 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 76 - 79.
- A. Hiroki, S. Odanaka, A. Goda:
"Massively Parallel Computation for Monte Carlo Device Simulation";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 18 - 19.
- S. Ho, A. Moriyoshi, I. Ohubu, O. Kagaya, H. Mizuta, K. Yamaguchi:
"Theoretical Analysis of Transconductance Enhancement due to Electron Concentration Dependent Screening in Heavily Doped Systems";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 174 - 175.
- S. Ho, M. Oohira, O. Kagaya, A. Moriyoshi, H. Mizuta, K. Yamaguchi:
"Dynamic Simulation of Multiple Trapping Processes and Anomalous Frequency Dependence in GaAs MESFETs";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 30 - 31.
- K. Horio, K. Satoh, H. Kusuki:
"Two-Dimensional Simulation of GaAs MESFETs Including Impact Ionization of Carriers and Carrier Trapping in the Semi-Insulating Substrate";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 100 - 101.
- T. Iizuka, H. Kato, M. Fukuma:
"An Influence of Electron-Electron Scatterings to Distribution Functions";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 106 - 107.
- G.-Y. Jin, Y.-J. Park, H.S. Min:
"A Simple Hot Electron Transport Model and its Prediction of Si-SiO2 Injection Probability";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 166 - 167.
- M. Johnson, A.J. Strojwas, D.W. Greve:
"Unified Set of Models for Minority Carrier Transport Parameters in Heavily Doped Monosilicon and Polysilicon";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 178 - 179.
- K. Kai, S. Kuroda, K. Nishi:
"Two-Dimensional Modeling of Self-Aligned Silicide Process with a General-Purpose Process Simulator OPUS";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 66 - 67.
- A. Kato, M. Katada, T. Hattori:
"An Efficient Decoupled Algorithm for Solving Energy Transport Equations";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 126 - 127.
- Z.M. Kovacs, A. Benedetti, A. Graffi, G. Masetti:
"A New Multilevel Simulator for MOS Integrated Circuits";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 160 - 161.
- T. Kunikiyo, Y. Kamakura, M. Yamaji, H. Mizuno, M. Takenaka, K. Taniguchi, C. Hamaguchi:
"Adjustable Parameter Free Monte Carlo Simulation for Electron Transport in Silicon Including Full Band Structure";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 40 - 41.
- J.B. Kuo, B.Y. Chen, H.P. Chen, T.C. Lu, J.H. Sim:
"A Numerical Simulation Study of SiGe/Si-Heterostructured PMOS and Bipolar Devices";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 104 - 105.
- I. Kurachi, N. Hwang, L. Forbes:
"Lifetime Prediction Model for Analog Devices Based on Drain Conductance Degradation due to Hot Carrier Injection";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 130 - 131.
- S. Kuroda, M. Okihara, N. Hirashita, K. Nishi:
"Effects of Nitride Viscosity on the Stress Distribution in LOCOS Structure";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 90 - 91.
- C.H. Lee, U. Ravaioli:
"Monte Carlo Simulation of Silicon Devices";
Talk: Conference, Nara, Japan (invited); 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 36 - 39.
- G.-H. Lee, S.S. Chung:
"Hydrodynamic Modeling of the Hot Electron Effect in Submicron MOSFET's Using a Simplified Energy Balance Equation";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 108 - 109.
- P.M. Lee:
"New Insights in Optimizing CMOS Inverter Circuits with Respect to Hot Carrier Degradation";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 154 - 155.
- S.-W. Lee:
"Characterization of Metallurgical Channel Length and Gate Electrode's Physical Dimension for Device Analysis and Calibration of Numerical Process and Device Simulators";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 112 - 113.
- F.A. Leon, S. Tazawa, K. Saito, A. Yoshii, D.L. Scharfetter:
"Numerical Algorithms for Precise Calculation of Surface Movement in 3D Topography Simulation";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 58 - 59.
- C.M. Li, T. Crandle, M. Temkin, P. Hopper:
"A Two-Dimensional Process Model for Silicide Growth";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 68 - 69.
- J. Lorenz, R.J. Wierzbicki:
"Efficient Multidimensional Simulation of Ion Implantation into Multilayer Structures";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 84 - 85.
- S. Matsuda, N. Itoh, C. Yoshino, Y. Tsuboi, Y. Katsumata, H. Iwai:
"Analysis of Mechanical Stress Associated with Trench Isolation Using a Two-Dimensional Simulation";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 64 - 65.
- H. Miura, N. Saito, H. Ohta, N. Okamoto, H. Masuda:
"Mechanical Stress Design System for Semiconductor Devices";
Talk: Conference, Nara, Japan (invited); 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 60 - 63.
- M. Miura-Mattausch, W. Bergner, D. Scharfetter:
"A New Consistent Description of MOSFET Performance for Circuit Simulation";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 134 - 135.
- K. Nabors, M. Kamon, J. White:
"Multipole Accelerated 3D Interconnect Analysis";
Talk: Conference, Nara, Japan (invited); 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 72 - 75.
- K. Nishinohara, H. Tanimoto, N. Konishi, S. Takagi, N. Shigyo:
"Non-Universal Roll-Off of MOSFET Mobility and VDs Effect in Mobility Measurement";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 176 - 177.
- J.Z. Peng, S. Longcor, J. Frey:
"Efficient Deep Submicron Flash-EPROM Device Simulation Using Energy Transport Model";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 168 - 169.
- A. Pierantoni, P. CiampoIini, A. Liuzzo, G. Baccarani:
"A Unified Model for the Simulation of Small-Geometry Devices";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 26 - 27.
- M.R. Pinto, J. Bude, C.S. Rafferty:
"Simulation of ULSI Silicon MOSFETs";
Talk: Conference, Nara, Japan (invited); 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 22 - 25.
- J. Poltz:
"Modeling VLSI Interconnections for Cross-Talk Simulation";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 144 - 145.
- C.S. Rafferty, M.D. Giles, H.-H. Vuong, S.A. Eshraghi, M.R. Pinto, S.J. HilIenius:
"Anomalous Short-Channel Body Coefficients due to Transient Enhanced Diffusion";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 148 - 149.
- H.C: Read, S. Kumashiro, A. Strojwas:
"Efficient Transient Device Simulation with AWE Macromodels and";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 34 - 35.
- N. Sano:
"Energy Broadening Associated with Finite Collision Duration in Hot Carrier Transport in Semiconductors";
Talk: Conference, Nara, Japan (invited); 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 162 - 165.
- H. Sato, K. Tsuneno, H. Masuda:
"Evaluation of Two-Dimensional Transient Enhanced Diffusion of Phosphorus during Shallow Junction Formation";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 86 - 87.
- S. Satoh, N. Nakayama:
"Parallel Computing Using a Mixed-Level Device-Circuit Simulator";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 128 - 129.
- E.W. Scheckler, T. Ogawa, S. Shukuri, E. Takeda:
"Material Representations and Algorithms for Nanometer-Scale Lithography Simulation";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 56 - 57.
- A. Schenk, U. Krumbein, S. Müller, H. Dettmer, W. Fichtner:
"On the Origin of Tunneling Currents in Scaled Silicon Devices";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 96 - 97.
- P. Scrobohaci, T.-W. Tang:
"A Non-Local Formulation of Impact Ionization for Silicon";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 172 - 173.
- L. Selmi, C. Fiegna, E. Sangiorgi, R. Bez, B. Ricco:
"A Study of Injection Conditions in the Substrate Hot Electron Induced Degradation of n-MOSFETs";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 156 - 157.
- N. Shigyo, Y. Niitsu:
"Effects of Physical Models on Bipolar AC Characteristics";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 114 - 115.
- J.H. Sim, J.B. Kuo:
"An Analytical Delayed-Turn-On Model for Accumulation-Type Ultra-Thin SOl PMOS Devices Operating at 77K";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 132 - 133.
- T. Skotnicki, G. Merckel, C. Denat:
"MASTAR - A Model for Analog Simulation of Sub-Threshold, Saturation, and Weak Avalanche Regions in MOSFETs";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 146 - 147.
- L. L. So, D. Chen, Z. Yu, R.W. Dutton:
"Robust Simulation of GaAs Devices Using Energy Transport Model";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 32 - 33.
- M. Stecher, B. Meinerzhagen, I. Bork, J.M. Krücken, P. Maas, W.L. Engl:
"Influence of Energy Transport Related Effects on NPN BJT Device Performance and ECL Gate Delay Analyzed by 2D Parallel Mixed Level Device/Circuit Simulation";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 170 - 171.
- M.A. Stettler, M.A. Alam, M.S. Lundstrom:
"Memory Efficient Scattering Matrix Device Simulation by Decomposing the Effect of Carrier Scattering and Field Acceleration";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 44 - 45.
- H. Stippel, S. Selberherr:
"Three-Dimensional Monte Carlo Simulation of Ion Implantation with Octree-Based Point Location";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 122 - 123.
- E. Strasser, K. Wimmer, S. Selberherr:
"A New Method for Simulation of Etching and Deposition Processes";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 54 - 55.
- K. Suzuki, T. Tanaka, H. Horie, Y. Arimoto, T. Itoh:
"Analytical Surface Potential Expression for Double-Gate SOl MOSFETs";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 150 - 151.
- K. Tanaka, P. CiampoIini, A. Pierantoni, G. Baccarani:
"Comparison between a Posteriori Error Indicators for Adaptive Mesh Generation";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 118 - 119.
- E. Tomacruz, J. Sanghavi, A. Sangiovanni-Vincenlelli:
"Algorithms for Drift-Diffusion Device Simulation Using Massively Parallel Processors";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 20 - 21.
- Y. Tsuboi, C. Fiegna, E. Sangiorgi, B. Ricco, T. Wada, Y. Katsumata, H. Iwai:
"Analysis of Collector Signal Delay in Bipolar Devices Using a Monte Carlo Method";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 98 - 99.
- K. Tsuneno, H. Sato, H. Masuda:
"Modeling and Simulation of Anomalous Degradation of Sub-μm NMOS's Current-Driving due to Velocity-Saturation Effect";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 152 - 153.
- T.-L. Tung:
"Feature-Scale Modeling and Characterization of Oxide APCVD";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 70 - 71.
- T. Uchida, N. Kotani, N. Tsubouchi:
"Verification of the Viscoelastic Oxidation Model Using Simple Test Structures";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 88 - 89.
- R.H. Wang, M.S. Karasick, A.R. Neureuther:
"Computational Evaluation of Three-Dimensional Topography Process Simulation Components";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 94 - 95.
- C. Werner:
"Equipment Simulation - State of the Art and Future Challenges";
Talk: Conference, Nara, Japan (invited); 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 6 - 9.
- W.T. Wong, D.X. Yang, R.W. Dutton, J.D. Plummer:
"Solid Modeling-Based Parametric Operations for Device Design";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 136 - 137.
- D. Yang, R.W. Dutton, K.H. Law:
"δ-Zone Triangulation: A Boundary Refinement Scheme for Quadtree Based Mesh";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 120 - 121.
- J.-J. Yang, S.S. Chung, P.-C. Chou, C.-S. Chen, M.-S. Lin:
"A Consistent Drain and Substrate Current Model of LDD MOS Devices for Circuit Simulation";
Poster: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 140 - 141.
- C.-S. Yao, D. Chen, R.W. Dutton, F. Venturi, E. Sangiorgi, A. Abramo:
"An Efficient Impact Ionization Model for Silicon Monte Carlo Simulation";
Talk: Conference, Nara, Japan; 1993-05-14 - 1993-05-15; in: "Proc. of VPAD", (1993), 0-7803-1338-0; 42 - 43.